Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. I: Mathematical formulation

DOI10.1016/j.ijsolstr.2005.05.002zbMath1121.74452OpenAlexW2124926815MaRDI QIDQ2459889

Yanyan Li

Publication date: 8 November 2007

Published in: International Journal of Solids and Structures (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.ijsolstr.2005.05.002

zbMATH Keywords

channeling crackvertical crackcontinuous distributions of dislocationscritical condition for crack formationepitaxial film/substrate systemAnisotropic elasticity

Mathematics Subject Classification ID

Brittle fracture (74R10) Thin films (74K35)

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Analysis of vertical cracking phenomena in tensile-strained epitaxial film on a substrate. II. Application to inxga1 - xas/InP system ⋮ Effect of elastic constants on crack channeling in a thin film bonded to an orthotropic substrate

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