Optimization of parallel-series self-testing for discrete devices
From MaRDI portal
Publication:2487659
DOI10.1023/B:AURC.0000038732.75638.3dzbMath1079.68509MaRDI QIDQ2487659
Publication date: 8 August 2005
Published in: Automation and Remote Control (Search for Journal in Brave)
94C12: Fault detection; testing in circuits and networks
68M15: Reliability, testing and fault tolerance of networks and computer systems