Defect detection of uneven brightness in low-contrast images using basis image representation

DOI10.1016/J.PATCOG.2009.09.006zbMath1187.68510OpenAlexW2059680383MaRDI QIDQ2654300

Yan-Hsin Tsneg, Du-Ming Tsai

Publication date: 15 January 2010

Published in: Pattern Recognition (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.patcog.2009.09.006

zbMATH Keywords

independent component analysissurface inspectionparticle swarm optimizationdefect detectionbasis image representation

Mathematics Subject Classification ID

Computing methodologies for image processing (68U10) Pattern recognition, speech recognition (68T10)

Uses Software

• FastICA

Cites Work

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• Using perceptual relation of regularity and anisotropy in the texture with independent component model for defect detection
• Independent component analysis for texture segmentation.
• An independent component analysis-based filter design for defect detection in low-contrast surface images
• A mura detection method
• Local feature analysis: a general statistical theory for object representation
• Liquid crystal display surface uniformity defect inspection using analysis of variance and exponentially weighted moving average techniques
• Learning the parts of objects by non-negative matrix factorization

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