A generalized correlated binomial distribution with application in multiple testing problems

DOI10.1007/s00184-008-0202-7zbMath1355.62007OpenAlexW2012146411MaRDI QIDQ2655282

Hui Tao, Ramesh C. Gupta

Publication date: 25 January 2010

Published in: Metrika (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s00184-008-0202-7

zbMATH Keywords

multiple testingbeta-binomial modelcorrelated binomial modelfalse discovery rates (FDR)

Mathematics Subject Classification ID

Exact distribution theory in statistics (62E15)

Related Items (3)

Statistical tests for the intersection of independent lists of genes: sensitivity, FDR, and type I error control ⋮ A COM-Poisson type generalization of the binomial distribution and its properties and applications ⋮ On Generalized Binomial and Negative Binomial Distributions for Dependent Bernoulli Variables

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