Extrapolated elliptic regularity and application to the van Roosbroeck system of semiconductor equations

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Publication:2656285



Abstract: In this paper we present a general extrapolated elliptic regularity result for second order differential operators in divergence form on fractional Sobolev-type spaces of negative order XDs−1,q(Omega) for s>0 small, including mixed boundary conditions and with a fully nonsmooth geometry of Omega and the Dirichlet boundary part D. We expect the result to find applications in the analysis of nonlinear parabolic equations, in particular for quasilinear problems or when treating coupled systems of equations. To demonstrate the usefulness of our result, we give a new proof of local-in-time existence and uniqueness for the van Roosbroeck system for semiconductor devices which is much simpler than already established proofs.


The authors consider the second-order differential operator in divergence form \(-\nabla\cdot \rho \nabla\), where \(\rho\) is a bounded measurable uniformly-a.e. positive definite coefficient matrix defined on a bounded domain \(\Omega\subset\mathbb{R}^d\) with nonsmooth boundary. By using an extrapolation technique, under some assumptions, they prove that there exists a positive number \(\bar s\) such that the regularity property \[-\nabla \cdot \rho \nabla u\in W_D^{s-1,q}(\Omega)\,\,\,\Rightarrow \,\,\,u\in W_D^{1+s,q}(\Omega)\leqno(1)\] holds for some \(q\in (1,\infty)\) and \(s\in (-\bar s,\bar s)\), where \(D\) is a subset of \(\Omega\). Here the subscript \(D\) means that the boundary trace on \(D\) is zero. The property (1) is also established for second-order operators with lower order terms and for boundary forms which arise from Robin boundary conditions. The local-in-time existence and uniqueness for the van Roosbroeck system for semiconductor devices using the extrapolated elliptic regularity result are finally obtained.



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