Defect detection from multi-frequency limited data via topological sensitivity

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Publication:275333

DOI10.1007/s10851-015-0611-yzbMath1337.76056OpenAlexW2200158341MaRDI QIDQ275333

José M. Vega, José Félix Funes, José Manuel Perales, María-Luisa Rapún

Publication date: 25 April 2016

Published in: Journal of Mathematical Imaging and Vision (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10851-015-0611-y




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