Multi-frequency topological derivative for approximate shape acquisition of curve-like thin electromagnetic inhomogeneities
DOI10.1016/J.JMAA.2013.03.040zbMATH Open1341.49053arXiv1207.0582OpenAlexW2046155034MaRDI QIDQ488686FDOQ488686
Publication date: 26 January 2015
Published in: Journal of Mathematical Analysis and Applications (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/1207.0582
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numerical methodstopological derivativethin electromagnetic inclusionsapproximate shape acquisitionmultiple frequencies
Inverse problems in optimal control (49N45) Optimization of shapes other than minimal surfaces (49Q10)
Cites Work
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Cited In (20)
- Detection of multiple impedance obstacles by non-iterative topological gradient based methods
- Application of the topological derivative to post-processing infrared time-harmonic thermograms for defect detection
- Improvement of direct sampling method in transverse electric polarization
- Stability and Resolution Analysis of Topological Derivative Based Localization of Small Electromagnetic Inclusions
- Defect detection from multi-frequency limited data via topological sensitivity
- Detecting damage in thin plates by processing infrared thermographic data with topological derivatives
- MUSIC-type imaging of perfectly conducting cracks in limited-view inverse scattering problems
- Noninvasive Imaging of Three-Dimensional Micro and Nanostructures by Topological Methods
- Shape reconstruction of thin electromagnetic inclusions via boundary measurements: level-set method combined with the topological derivative
- Processing the 2D and 3D Fresnel experimental databases via topological derivative methods
- Investigation of a non-iterative technique based on topological derivatives for fast localization of small conductivity inclusions
- Direct sampling method for imaging small dielectric inhomogeneities: analysis and improvement
- Analysis of multi-frequency subspace migration weighted by natural logarithmic function for fast imaging of two-dimensional thin, arc-like electromagnetic inhomogeneities
- Topological Sensitivity for Solving Inverse Multiple Scattering Problems in Three-dimensional Electromagnetism. Part I: One Step Method
- Analysis of a multi-frequency electromagnetic imaging functional for thin, crack-like electromagnetic inclusions
- Performance analysis of multi-frequency topological derivative for reconstructing perfectly conducting cracks
- Topological derivative for imaging of thin electromagnetic inhomogeneity: least condition of incident directions
- Multi-frequency subspace migration for imaging of perfectly conducting, arc-like cracks in full- and limited-view inverse scattering problems
- Topological derivative-based technique for imaging thin inhomogeneities with few incident directions
- A boundary integral formulation and a topological energy-based method for an inverse 3D multiple scattering problem with sound-soft, sound-hard, penetrable, and absorbing objects
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