A new test for new better than used in expectation lifetimes
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Publication:2807617
DOI10.1080/03610926.2013.824101zbMATH Open1338.62133OpenAlexW1978978156MaRDI QIDQ2807617FDOQ2807617
Ganesh Malla, Edgardo Lorenzo, Hari Mukerjee
Publication date: 25 May 2016
Published in: Communications in Statistics. Theory and Methods (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610926.2013.824101
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Nonparametric hypothesis testing (62G10) Censored data models (62N01) Reliability and life testing (62N05)
Cites Work
- A class of tests for exponentiality against decreasing mean residual life alternatives
- Testing Whether New is Better than Used
- Estimation of a biometric function
- Tests for the mean residual life
- On the performance of a new test of exponentiality against IFR alternatives based on the L-statistic approach
- Testing for new is better than used in expectation
- A generalized Hollander-Proschan type test for NBUE alternatives
- Likelihood Ratio Tests for Restricted Families of Probability Distributions
- A Comparative Study of Several One-Sided Goodness-of-Fit Tests
- Asymptotically Minimax Distribution-free Procedures
Cited In (6)
- A simple test for new better than used in expectation
- Testing whether new better than used in expectation for random censorship for random censorship
- Quantile based tests for exponentiality against DMRQ and NBUE alternatives
- Title not available (Why is that?)
- A simple test of exponentiality against NWBUE family of life distributions
- On tests of new better than renewal used classes
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