Determination of the conductance and thickness of semiconductor wafers and nanometer layers with the use of one-dimensional microwave photonic crystals

DOI10.1134/S1028335813010023MaRDI QIDQ2840189zbMATH OpenOpenAlexWikidataFDO

Authors S. A. Nikitov, Yu. V. Gulyaev, D. A. Usanov, A. V. Skripal', D. V. Ponomarev

Publication date 17 July 2013

Published in Doklady Akademii Nauk (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1134/s1028335813010023

zbMATH Keywords

semiconductorswave parametersmultilayer photonic crystal

Mathematics Subject Classification ID

Waves and radiation in optics and electromagnetic theory (78A40) Statistical mechanics of crystals (82D25) Statistical mechanics of semiconductors (82D37) Statistical mechanics of nanostructures and nanoparticles (82D80)

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Cited in

(2)

• Optimization of the inhibition of atmospheric window emission using photonic crystals
• Determination of parameters of thin semiconductor layers on the basis of one-dimensional microwave photon crystals

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