Determination of the conductance and thickness of semiconductor wafers and nanometer layers with the use of one-dimensional microwave photonic crystals

DOI10.1134/S1028335813010023zbMATH Open1274.82084OpenAlexW2083053948WikidataQ57670812 ScholiaQ57670812MaRDI QIDQ2840189FDOQ2840189

Authors: S. A. Nikitov, Yu. V. Gulyaev, D. A. Usanov, A. V. Skripal', D. V. Ponomarev 

Publication date: 17 July 2013

Published in: Doklady Akademii Nauk (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1134/s1028335813010023

Recommendations

• Wave propagation in photonic crystal models.
• A new wave theory of photonic crystals
• The quantum transmission characteristic of one-dimensional photonic crystals
• MULTEM 2: A new version of the program for transmission and band-structure calculations of photonic crystals.
• Appropriate truncation for photonic crystals

zbMATH Keywords

semiconductorswave parametersmultilayer photonic crystal

Mathematics Subject Classification ID

Waves and radiation in optics and electromagnetic theory (78A40) Statistical mechanics of crystals (82D25) Statistical mechanics of semiconductors (82D37) Statistical mechanics of nanostructures and nanoparticles (82D80)

Cited In (2)

• Optimization of the inhibition of atmospheric window emission using photonic crystals
• Determination of parameters of thin semiconductor layers on the basis of one-dimensional microwave photon crystals

This page was built for publication: Determination of the conductance and thickness of semiconductor wafers and nanometer layers with the use of one-dimensional microwave photonic crystals

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2840189)