Designing a Degradation Test with a Two-Parameter Exponential Lifetime Distribution
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Publication:2876115
DOI10.1080/03610918.2013.815769zbMATH Open1466.62407OpenAlexW2024851753MaRDI QIDQ2876115FDOQ2876115
Authors: Hong-Fwu Yu, Chien-Yu Peng 
Publication date: 18 August 2014
Published in: Communications in Statistics. Simulation and Computation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610918.2013.815769
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Cites Work
- Title not available (Why is that?)
- Title not available (Why is that?)
- Modeling event times with multiple outcomes using the Wiener process with drift
- Title not available (Why is that?)
- Computational Methods for Multiplicative Intensity Models Using Weighted Gamma Processes
- Review and implementation of cure models based on first hitting times for Wiener processes
- Accelerated Testing
- Survival in dynamic environments
- Covariates and random effects in a Gamma process model with application to degradation and failure
- A generalized confidence limit for the reliability function of a two-parameter exponential distribution
- Accelerated degradation models for failure based on geometric Brownian motion and gamma processes
- Estimating degradation by a Wiener diffusion process subject to measurement error
- Stochastic processes directed by randomized time
- Inhomogeneous and modulated gamma processes
- Simultaneous one-sided prediction intervals for a two-parameter exponential distribution using complete or type II censored data
- Planning accelerated life tests for censored two-parameter exponential distributions
- Gaussian models for degradation processes. I: Methods for the analysis of biomarker data
- Designing a screening experiment for highly reliable products
- On a scheme for predictive maintenance
- Designing a degradation experiment
- Characterizations of Competing Risks in Terms of Independent‐Risks Proxy Models
Cited In (5)
- Designing a degradation experiment
- A Two-Stage Life Test for the Exponential Parameter
- Optimal sequential Bayesian analysis for degradation tests
- Designing an accelerated degradation experiment with a reciprocal Weibull degradation rate
- Optimization of product life test and degradation test under cost constraints
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