Designing a Degradation Test with a Two-Parameter Exponential Lifetime Distribution
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Publication:2876115
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Cites work
- scientific article; zbMATH DE number 1198868 (Why is no real title available?)
- scientific article; zbMATH DE number 1862734 (Why is no real title available?)
- scientific article; zbMATH DE number 775283 (Why is no real title available?)
- A generalized confidence limit for the reliability function of a two-parameter exponential distribution
- Accelerated Testing
- Accelerated degradation models for failure based on geometric Brownian motion and gamma processes
- Characterizations of Competing Risks in Terms of Independent‐Risks Proxy Models
- Computational Methods for Multiplicative Intensity Models Using Weighted Gamma Processes
- Covariates and random effects in a Gamma process model with application to degradation and failure
- Designing a degradation experiment
- Designing a screening experiment for highly reliable products
- Estimating degradation by a Wiener diffusion process subject to measurement error
- Gaussian models for degradation processes. I: Methods for the analysis of biomarker data
- Inhomogeneous and modulated gamma processes
- Modeling event times with multiple outcomes using the Wiener process with drift
- On a scheme for predictive maintenance
- Planning accelerated life tests for censored two-parameter exponential distributions
- Review and implementation of cure models based on first hitting times for Wiener processes
- Simultaneous one-sided prediction intervals for a two-parameter exponential distribution using complete or type II censored data
- Stochastic processes directed by randomized time
- Survival in dynamic environments
Cited in
(5)- Designing a degradation experiment
- A Two-Stage Life Test for the Exponential Parameter
- Optimal sequential Bayesian analysis for degradation tests
- Designing an accelerated degradation experiment with a reciprocal Weibull degradation rate
- Optimization of product life test and degradation test under cost constraints
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