An improved testing scheme for catastrophic fault patterns

DOI10.1016/S0020-0190(00)00012-0MaRDI QIDQ294739zbMATH OpenOpenAlexFDO

Authors A. Nayak, J. Ren, N. Santoro

Publication date 16 June 2016

Published in Information Processing Letters (Search for Journal in Brave)

Full work available at URL http://www.sciencedirect.com/science/article/pii/S0020019000000120?np=y

zbMATH Keywords

algorithmscatastrophic faultsredundant arraystesting schemes

Mathematics Subject Classification ID

Reliability, testing and fault tolerance of networks and computer systems (68M15)

Cites work

• scientific article; zbMATH DE number 434680 (Why is no real title available?)
• A note on isomorphic chordal rings
• Catastrophic faults in reconfigurable systolic linear arrays
• Counting the number of fault patterns in redundant VLSI arrays
• Efficient construction of catastrophic patterns for VLSI reconfigurable arrays
• On graphs preserving rectilinear shortest paths in the presence of obstacles
• On testing for catastrophic faults in reconfigurable arrays with arbitrary link redundancy
• Testing and reconfiguration of VLSI linear arrays

Cited in

(3)

• Irreversible conversion of graphs
• Reversible iterative graph processes
• Triggering cascades on strongly connected directed graphs

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