Accelerated Markov chain Monte Carlo sampling in electrical capacitance tomography

DOI10.1108/03321641111168147zbMATH Open1360.65027OpenAlexW2033442517MaRDI QIDQ2970514FDOQ2970514

Authors: Daniel Watzenig, Markus Neumayer, Colin Fox 

Publication date: 30 March 2017

Published in: COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering (Search for Journal in Brave)

Full work available at URL: https://semanticscholar.org/paper/76dcd2d63d4e2268f51996f82dcdd19456b6e9bc

Recommendations

• Statistical inversion and Monte Carlo sampling methods in electrical impedance tomography
• Randomized reduced forward models for efficient Metropolis-Hastings MCMC, with application to subsurface fluid flow and capacitance tomography
• Numerical modelling and analysis of the forward and inverse problems in electrical capacitance tomography
• Expectation propagation for nonlinear inverse problems -- with an application to electrical impedance tomography
• Recovery of inclusion shape by statistical inversion of non-stationary tomographic measurement data

zbMATH Keywords

MCMC samplingMonte Carlo methodsMarkov processesmodel reductionelectrical capacitance tomographystatistical inversion

Mathematics Subject Classification ID

Monte Carlo methods (65C05) Biological applications of optics and electromagnetic theory (78A70) Physiological flow (92C35)

Cites Work

• Statistical and computational inverse problems.
• Approximation errors in nonstationary inverse problems
• Accelerated Markov chain Monte Carlo sampling in electrical capacitance tomography
• Influence of the discretization error on the reconstruction accuracy in electrical capacitance tomography

Cited In (3)

• Accelerated Markov chain Monte Carlo sampling in electrical capacitance tomography
• Eddy current tomography using a binary Markov model
• Recovery of inclusion shape by statistical inversion of non-stationary tomographic measurement data

This page was built for publication: Accelerated Markov chain Monte Carlo sampling in electrical capacitance tomography

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2970514)