A new control scheme always better than X-bar chart

DOI10.1080/03610920903243744zbMATH Open1202.62188OpenAlexW1966200948MaRDI QIDQ3064087FDOQ3064087

Authors: Sang-Ho Lee, Chi-Hyuck Jun 

Publication date: 20 December 2010

Published in: Communications in Statistics: Theory and Methods (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/03610920903243744

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zbMATH Keywords

multiple testingaverage run lengthquality controlmean shift\(P\)-value

Mathematics Subject Classification ID

Parametric hypothesis testing (62F03) Applications of statistics in engineering and industry; control charts (62P30) Paired and multiple comparisons; multiple testing (62J15)

Cites Work

• A Direct Approach to False Discovery Rates
• Rectangular Confidence Regions for the Means of Multivariate Normal Distributions
• CONTINUOUS INSPECTION SCHEMES
• A Simple Method for Studying Run-Length Distributions of Exponentially Weighted Moving Average Charts
• Discussion on “Is Average Run Length to False Alarm Always an Informative Criterion?” by Yajun Mei

Cited In (2)

• A process monitoring scheme controlling false discovery rate
• An exponentially weighted moving average chart controlling false discovery rate

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