An integrated probabilistic model for assessing a nanocomponent's reliability

DOI10.1239/JAP/1316796918MaRDI QIDQ3094697zbMATH OpenOpenAlexFDO

Authors Nader Ebrahimi, Yarong Yang

Publication date 25 October 2011

Published in Journal of Applied Probability (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1239/jap/1316796918

zbMATH Keywords

reliabilityGibbs samplingMarkov random fieldsassociated random variablesGibbs distributionconditionally increasing in sequence

Mathematics Subject Classification ID

Reliability and life testing (62N05) Applications of statistics to physics (62P35) Reliability, availability, maintenance, inspection in operations research (90B25)

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• Assessing a Linear Nanosystem's Limiting Reliability from its Components
• Limiting results for arrays of binary random variables on rectangular lattices under sparseness conditions

Cited in

(5)

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• Assessing the reliability of a nanocomponent using nanocrack growth
• Assessing the reliability function of nanocomponents
• Assessing a Linear Nanosystem's Limiting Reliability from its Components
• A two-dimensional probability model for evaluating reliability of piezoelectric micro-actuators

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