An integrated probabilistic model for assessing a nanocomponent's reliability

DOI10.1239/JAP/1316796918zbMATH Open1241.62142OpenAlexW1995194067MaRDI QIDQ3094697FDOQ3094697

Authors: Nader Ebrahimi, Yarong Yang 

Publication date: 25 October 2011

Published in: Journal of Applied Probability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1239/jap/1316796918

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zbMATH Keywords

reliabilityGibbs samplingMarkov random fieldsassociated random variablesGibbs distributionconditionally increasing in sequence

Mathematics Subject Classification ID

Reliability and life testing (62N05) Applications of statistics to physics (62P35) Reliability, availability, maintenance, inspection in operations research (90B25)

Cites Work

• Title not available (Why is that?)
• Title not available (Why is that?)
• Title not available (Why is that?)
• Limiting results for arrays of binary random variables on rectangular lattices under sparseness conditions
• Assessing a Linear Nanosystem's Limiting Reliability from its Components

Cited In (5)

• Assessing the reliability of a nanocomponent using nanocrack growth
• Assessing the reliability function of nanocomponents
• Assessing a Linear Nanosystem's Limiting Reliability from its Components
• A two-dimensional probability model for evaluating reliability of piezoelectric micro-actuators
• Title not available (Why is that?)

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