Assessing a Linear Nanosystem's Limiting Reliability from its Components

DOI10.1239/JAP/1222441834MaRDI QIDQ3535642zbMATH OpenOpenAlexFDO

Authors Nader Ebrahimi

Publication date 13 November 2008

Published in Journal of Applied Probability (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1239/jap/1222441834

zbMATH Keywords

binomial distributionreliabilityassociated random variableslinear nanosystem

Mathematics Subject Classification ID

Reliability and life testing (62N05) Point processes (e.g., Poisson, Cox, Hawkes processes) (60G55) Reliability, availability, maintenance, inspection in operations research (90B25)

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Cites work

• scientific article; zbMATH DE number 3513115 (Why is no real title available?)
• scientific article; zbMATH DE number 3591262 (Why is no real title available?)
• scientific article; zbMATH DE number 2020395 (Why is no real title available?)
• Binary structure functions with dependent components
• Limiting results for arrays of binary random variables on rectangular lattices under sparseness conditions

Cited in

(3)

• Assessing the reliability of a nanocomponent using nanocrack growth
• Assessing the reliability function of nanocomponents
• An integrated probabilistic model for assessing a nanocomponent's reliability

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