Assessing a Linear Nanosystem's Limiting Reliability from its Components

DOI10.1239/JAP/1222441834zbMATH Open1165.90419OpenAlexW2086896899MaRDI QIDQ3535642FDOQ3535642

Authors: Nader Ebrahimi 

Publication date: 13 November 2008

Published in: Journal of Applied Probability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1239/jap/1222441834

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zbMATH Keywords

binomial distributionreliabilityassociated random variableslinear nanosystem

Mathematics Subject Classification ID

Reliability and life testing (62N05) Point processes (e.g., Poisson, Cox, Hawkes processes) (60G55) Reliability, availability, maintenance, inspection in operations research (90B25)

Cites Work

• Title not available (Why is that?)
• Title not available (Why is that?)
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• Limiting results for arrays of binary random variables on rectangular lattices under sparseness conditions
• Binary structure functions with dependent components

Cited In (3)

• Assessing the reliability of a nanocomponent using nanocrack growth
• Assessing the reliability function of nanocomponents
• An integrated probabilistic model for assessing a nanocomponent's reliability

Uses Software

• spBayes

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