A method for automatic inspection of printed circuit boards

DOI10.1016/1049-9660(91)90039-RMaRDI QIDQ3136099zbMATH OpenOpenAlexFDO

Authors Alan P. Sprague, M. J. Donahue, Stanislav I. Rokhlin

Publication date 22 September 1993

Published in CVGIP: Image Understanding (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1016/1049-9660(91)90039-r

zbMATH Keywords

design-rulereference-comparisonsegment graph

Mathematics Subject Classification ID

Computing methodologies for image processing (68U10)

Recommendations

• Non-referential, self-compared shape defect inspection for bond pads with deformed shapes
• scientific article; zbMATH DE number 1712380
• Automatic visual inspection of surface mount solder joint defects
• scientific article; zbMATH DE number 1708117
• A method for vertex recognition in an automated vision system

Cited in

(9)

• Non-referential, self-compared shape defect inspection for bond pads with deformed shapes
• Automated inspection of IC wafer contamination
• scientific article; zbMATH DE number 2043403 (Why is no real title available?)
• scientific article; zbMATH DE number 1708117 (Why is no real title available?)
• scientific article; zbMATH DE number 1712380 (Why is no real title available?)
• Ball grid array (BGA) substrate conduct paths inspection using two-dimensional wavelet transform
• Reference architecture for open and integrated automatic optical inspection systems
• Improved PCB inspection: computational issues
• Some new analogic CNN algorithms for PCB quality control

This page was built for publication: A method for automatic inspection of printed circuit boards

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3136099)