scientific article; zbMATH DE number 4181295

zbMATH Open0716.94020MaRDI QIDQ3204431FDOQ3204431

Authors: Andrzej Hławiczka 

Publication date: 1990

Title of this publication is not available (Why is that?)

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zbMATH Keywords

linear feedback shift registerbuilt-in self-testbuilt-in evaluatorsexclusive-OR typelinear time compressionmulti input shift register

Mathematics Subject Classification ID

Shift register sequences and sequences over finite alphabets in information and communication theory (94A55) Fault detection; testing in circuits and networks (94C12)

Cited In (1)

• The method of parallel-sequential built-in self-testing in integrated circuits of the type sFPGAs

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