Kinetic Monte Carlo Analysis of the Operation and Reliability of Oxide Based RRAMs

DOI10.1007/978-3-030-41032-2_49OpenAlexW3006395821MaRDI QIDQ3297724FDOQ3297724

Authors: Toufik Sadi, Oves Badami, Vihar Georgiev, Asen Asenov 

Publication date: 20 July 2020

Published in: Large-Scale Scientific Computing (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/978-3-030-41032-2_49

zbMATH Keywords

kinetic Monte Carlotransport phenomenanano-devicesRRAM reliability

Mathematics Subject Classification ID

Numerical analysis (65-XX)

Cites Work

• Impact of the trap attributes on the gate leakage mechanisms in a 2D MS-EMC nanodevice simulator
• Microscopic KMC modeling of oxide rrams

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