Pattern recognition at different scales: a statistical perspective
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Publication:336155
Abstract: In this paper we borrow concepts from Information Theory and Statistical Mechanics to perform a pattern recognition procedure on a set of x-ray hazelnut images. We identify two relevant statistical scales, whose ratio affects the performance of a machine learning algorithm based on statistical observables, and discuss the dependence of such scales on the image resolution. Finally, by averaging the performance of a Support Vector Machines algorithm over a set of training samples, we numerically verify the predicted onset of an optimal scale of resolution, at which the pattern recognition is favoured.
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- Pattern recognition in non-Kolmogorovian structures
- Image characterization by fractal descriptors in variational mode decomposition domain: application to brain magnetic resonance
- SIMBAD: emergence of pattern similarity
- Recognition of chain-coded patches with statistical methods
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