Fast non-iterative methods for defect identification
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Publication:3540848
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Cited in
(9)- Topological derivative for imaging of thin electromagnetic inhomogeneity: least condition of incident directions
- Performance analysis of multi-frequency topological derivative for reconstructing perfectly conducting cracks
- Detection of small inhomogeneities via direct sampling method in transverse electric polarization
- An augmented time reversal method for source and scatterer identification
- Shape identification of open sound-hard arcs without priori information in limited-view inverse scattering problem
- Investigation of a non-iterative technique based on topological derivatives for fast localization of small conductivity inclusions
- Defect detection from multi-frequency limited data via topological sensitivity
- Topological sensitivity for solving inverse multiple scattering problems in three-dimensional electromagnetism. II: Iterative method
- Topological derivative for a fast identification of short, linear perfectly conducting cracks with inaccurate background information
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