Higher-order topological sensitivity for 2-D potential problems. Application to fast identification of inclusions
DOI10.1016/J.IJSOLSTR.2009.01.021zbMATH Open1217.74095OpenAlexW2016333954MaRDI QIDQ546701FDOQ546701
Authors: Marc Bonnet
Publication date: 24 June 2011
Published in: International Journal of Solids and Structures (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.ijsolstr.2009.01.021
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Cited In (24)
- A semismooth Newton method for topology optimization
- First- and second-order topological sensitivity analysis for inclusions
- Topological sensitivity-based analysis and optimization of microstructured interfaces
- Topological sensitivity for solving inverse multiple scattering problems in three-dimensional electromagnetism. II: Iterative method
- Topological derivatives of shape functionals. part III: second-order method and applications
- Microstructural topological sensitivities of the second-order macroscopic model for waves in periodic media
- A new reconstruction method for the inverse potential problem
- Fast identification of cracks using higher-order topological sensitivity for 2-D potential problems
- A FEM-based topological sensitivity approach for fast qualitative identification of buried cavities from elastodynamic overdetermined boundary data
- Fast non-iterative methods for defect identification
- Topological sensitivity analysis for identification of voids under Navier's boundary conditions in linear elasticity
- Complete topological asymptotic expansion for \(L_2\) and \(H^1\) tracking-type cost functionals in dimension two and three
- Second-order topological expansion for electrical impedance tomography
- Topological optimality condition for the identification of the center of an inhomogeneity
- Noniterative reconstruction method for an inverse potential problem modeled by a modified Helmholtz equation
- Shape aware quadratures
- On the Kohn-Vogelius formulation for solving an inverse source problem
- Higher order topological derivatives in elasticity
- A shape optimization approach for electrical impedance tomography with point measurements
- Topological sensitivity analysis of inclusion in two-dimensional linear elasticity
- Topological derivative for the inverse conductivity problem: a Bayesian approach
- Construct Deep Neural Networks based on Direct Sampling Methods for Solving Electrical Impedance Tomography
- A new non-iterative reconstruction method for the electrical impedance tomography problem
- Topological derivative-based technique for imaging thin inhomogeneities with few incident directions
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