Fitting Stochastic Volatility Models in the Presence of Irregular Sampling via Particle Methods and the EM Algorithm

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Publication:3552853

DOI10.1111/j.1467-9892.2008.00584.xzbMath1199.62042OpenAlexW2137166976MaRDI QIDQ3552853

David S. Stoffer, Jeongeun Kim

Publication date: 22 April 2010

Published in: Journal of Time Series Analysis (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1111/j.1467-9892.2008.00584.x



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