Improved tri-layered interfacial stress model with the effect of different temperatures in the layers
DOI10.1007/S00419-010-0437-4zbMATH Open1271.74055OpenAlexW2041110856MaRDI QIDQ363442FDOQ363442
Authors: D. Sujan, M. V. V. Murthy, Kankanhalli N. Seetharamu
Publication date: 2 September 2013
Published in: Archive of Applied Mechanics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/s00419-010-0437-4
Recommendations
- Analytical elasto-creep model of interfacial thermal stresses and strains in trilayer assemblies
- Analysis of interfacial thermal stresses of chip-substrate structure
- Finite element modeling of a microelectronic structure under uniform thermal loading.
- Crack-inclusion interaction due to mismatched thermal expansion under plane stress condition
- An analytical model for thermal residual interface stresses in continuous fiber-reinforced composites
different uniform temperature modelelectronic packagingexponent parameterlinear temperature gradientpeeling stressshearing stresstri-layered model
Cited In (5)
- Modulation of heat flux and thermal stress at the double interface by nano-coating thickness
- Analysis of interfacial thermal stresses of chip-substrate structure
- Delamination in patterned films
- Analytical elasto-creep model of interfacial thermal stresses and strains in trilayer assemblies
- On a simple shell model for thin structures with functionally graded materials
This page was built for publication: Improved tri-layered interfacial stress model with the effect of different temperatures in the layers
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q363442)