scientific article; zbMATH DE number 3906403

zbMATH Open0567.94024MaRDI QIDQ3684045FDOQ3684045

Authors: J. C. Muzio 

Publication date: 1985

Title of this publication is not available (Why is that?)

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zbMATH Keywords

stuck-at faultsbridging faultstesting of digital circuitssyndrome testingfault signaturesspectral testing

Mathematics Subject Classification ID

Cited In (5)

• Effectiveness of multiple compressions of multiple signatures
• On the recovery of error patterns from signatures obtained in digital system testing
• A scheme of test data compression based on coding of even bits marking and selective output inversion
• Application of group and expansion code in test data compression
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