scientific article; zbMATH DE number 3906403

MaRDI QIDQ3684045zbMATH OpenFDO

Authors J. C. Muzio

Publication date 1985

zbMATH Keywords

stuck-at faultsbridging faultstesting of digital circuitssyndrome testingfault signaturesspectral testing

Mathematics Subject Classification ID

Recommendations

• scientific article; zbMATH DE number 3859044
• scientific article; zbMATH DE number 47895
• On the recovery of error patterns from signatures obtained in digital system testing
• Analysis of signature testability of digital circuits
• Publication:3468599

Cited in

(5)

• Effectiveness of multiple compressions of multiple signatures
• Application of group and expansion code in test data compression
• scientific article; zbMATH DE number 3859044 (Why is no real title available?)
• A scheme of test data compression based on coding of even bits marking and selective output inversion
• On the recovery of error patterns from signatures obtained in digital system testing

This page was built for publication:

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3684045)