Fault Propagation Through Embedded Multiport Memories

DOI10.1109/TC.1987.1676944MaRDI QIDQ3753936zbMATH OpenOpenAlexFDO

Authors Jacob Savir, William H. McAnney, Salvatore R. Vecchio

Publication date 1987

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.1987.1676944

zbMATH Keywords

Markov chainfault detectiondetection probabilitylogic testingembedded memorymultiport random access memoryrandom pattern testability of permanent faultsself- testing

Mathematics Subject Classification ID

Markov chains (discrete-time Markov processes on discrete state spaces) (60J10)

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Cited in

(8)

• scientific article; zbMATH DE number 2172010 (Why is no real title available?)
• The effect of program behavior on fault observability
• Fault Attacks on Combiners with Memory
• Analysis of multibackground memory testing techniques
• A fault primitive based model of all static four-cell coupling faults in random-access memories
• Nondestructive RAM testing by analyzing the output data for symmetry
• Dynamic neighbourhood pattern-sensitive faults in random-access memories. A fault coverage evaluation
• Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests

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