Fault Propagation Through Embedded Multiport Memories

DOI10.1109/TC.1987.1676944zbMATH Open0612.94019OpenAlexW1898273931MaRDI QIDQ3753936FDOQ3753936

Authors: Jacob Savir, William H. McAnney, Salvatore R. Vecchio 

Publication date: 1987

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.1987.1676944

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zbMATH Keywords

Markov chainfault detectiondetection probabilitylogic testingembedded memorymultiport random access memoryrandom pattern testability of permanent faultsself- testing

Mathematics Subject Classification ID

Markov chains (discrete-time Markov processes on discrete state spaces) (60J10)

Cited In (8)

• Title not available (Why is that?)
• The effect of program behavior on fault observability
• Fault Attacks on Combiners with Memory
• Analysis of multibackground memory testing techniques
• A fault primitive based model of all static four-cell coupling faults in random-access memories
• Nondestructive RAM testing by analyzing the output data for symmetry
• Dynamic neighbourhood pattern-sensitive faults in random-access memories. A fault coverage evaluation
• Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests

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