Fault Propagation Through Embedded Multiport Memories

DOI10.1109/TC.1987.1676944MaRDI QIDQ3753936zbMATH OpenOpenAlexFDO

Authors Jacob Savir, William H. McAnney, Salvatore R. Vecchio

Publication date 1987

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tc.1987.1676944

zbMATH Keywords

Markov chainfault detectiondetection probabilitylogic testingembedded memorymultiport random access memoryrandom pattern testability of permanent faultsself- testing

Mathematics Subject Classification ID

Markov chains (discrete-time Markov processes on discrete state spaces) (60J10)

Recommendations

• Fault Attacks on Combiners with Memory
• Fault-tolerant shared memory simulations
• Fault Tolerant External Memory Algorithms
• Catastrophic faults in reconfigurable systolic linear arrays
• Formal Probabilistic Analysis of Stuck-at Faults in Reconfigurable Memory Arrays

Cited in

(8)

• Fault Attacks on Combiners with Memory
• The effect of program behavior on fault observability
• Address Sequences and Backgrounds with Different Hamming Distances for Multiple Run March Tests
• A fault primitive based model of all static four-cell coupling faults in random-access memories
• Analysis of multibackground memory testing techniques
• scientific article; zbMATH DE number 2172010 (Why is no real title available?)
• Nondestructive RAM testing by analyzing the output data for symmetry
• Dynamic neighbourhood pattern-sensitive faults in random-access memories. A fault coverage evaluation

This page was built for publication: Fault Propagation Through Embedded Multiport Memories

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3753936)