scientific article; zbMATH DE number 4023204

MaRDI QIDQ3765710zbMATH OpenFDO

Authors M. G. Karpovsky, Lev B. Levitin

Publication date 1985

zbMATH Keywords

combinational circuitssequential circuitsuniversal testing

Mathematics Subject Classification ID

Recommendations

• scientific article; zbMATH DE number 4191094
• Controlled random tests
• Design of universal test sequences for VLSI
• Theory of Program Testing-An Overview
• scientific article; zbMATH DE number 5260272

This page was built for publication:

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3765710)