A Bayes Reliability Growth Model for A Development Testing Program

DOI10.1109/TR.1987.5222474MaRDI QIDQ3774787zbMATH OpenOpenAlexFDO

Authors Nasser Fard, Duane L. Dietrich

Publication date 1987

Published in IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tr.1987.5222474

zbMATH Keywords

binomial test datadevelopment processmarginal posterior distributionsordered reliabilitiesreliability growth modelssimulation models

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

Cited in

(2)

• Achieving growth in reliability
• Bayesian reliability analysis using the Dirichlet prior distribution with emphasis on accelerated life testing run in random order

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