Minimal Redundant Logic for High Reliability and Irredundant Testability

DOI10.1109/TC.1980.1675636zbMath0436.94042OpenAlexW2001241617MaRDI QIDQ3877580

Jon G. Bredeson, John Sutton

Publication date: 1980

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tc.1980.1675636

zbMATH Keywords

reliabilityirredundant testabilitymultilevel fanout free circuitsredundant connectionsredundant logicstatic logic hazardtriple modular redundancy

Mathematics Subject Classification ID

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