A Simple Procedure to Generate Optimum Test Patterns for Parity Logic Networks

DOI10.1109/TC.1981.1675793zbMath0463.94017MaRDI QIDQ3914897

Se June Hong, Daniel L. Ostapko

Publication date: 1981

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

zbMATH Keywords

optimum testingEX-OR gateparity tree

Mathematics Subject Classification ID