Semi-modularity and testability of speed-independent circuits

DOI10.1016/0167-9260(92)90033-UzbMATH Open0758.94016OpenAlexW2079389379MaRDI QIDQ4015502FDOQ4015502

Authors: Peter A. Beerel, Teresa H.-Y. Meng 

Publication date: 13 January 1993

Published in: Integration (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/0167-9260(92)90033-u

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zbMATH Keywords

stuck-at-faultsasynchronous circuitssemi-modularitypure chaos delay modelself-checking propertytestability of speed-independent circuits

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cited In (2)

• Analysis and identification of speed-independent circuits on an event model
• Self-dual self-testing multicycle circuits: Their properties

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