On the application of probabilistic distance measures for the extraction of features from imperfectly labeled patterns
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Publication:4048626
DOI10.1007/BF00976057zbMath0295.68071MaRDI QIDQ4048626
Publication date: 1973
Published in: International Journal of Computer & Information Sciences (Search for Journal in Brave)
Related Items
Learning with imperfectly labeled patterns, Estimation of probabilities of label imperfections and correction of mislabels
Cites Work
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