On the application of probabilistic distance measures for the extraction of features from imperfectly labeled patterns

DOI10.1007/BF00976057zbMATH Open0295.68071MaRDI QIDQ4048626FDOQ4048626

Authors: C. Chitti Babu 

Publication date: 1973

Published in: International Journal of Computer & Information Sciences (Search for Journal in Brave)

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10)

Cites Work

• Title not available (Why is that?)
• On the best finite set of linear observables for discriminating two Gaussian signals
• Title not available (Why is that?)
• Probability of error, equivocation, and the Chernoff bound
• Feature Selection in Pattern Recognition
• Title not available (Why is that?)
• An Error Correcting Procedure for Learning with an Imperfect Teacher
• On feature extraction in pattern recognition†
• On the Extraction of Pattern Features from Continuous Measurements
• On the Extraction of Pattern Features from Imperfectly Identified Samples

Cited In (2)

• Estimation of probabilities of label imperfections and correction of mislabels
• Learning with imperfectly labeled patterns

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