On the application of probabilistic distance measures for the extraction of features from imperfectly labeled patterns

DOI10.1007/BF00976057MaRDI QIDQ4048626zbMATH OpenFDO

Authors C. Chitti Babu

Publication date 1973

Published in International Journal of Computer & Information Sciences (Search for Journal in Brave)

Mathematics Subject Classification ID

Pattern recognition, speech recognition (68T10)

Cites work

• scientific article; zbMATH DE number 3122734 (Why is no real title available?)
• scientific article; zbMATH DE number 3135403 (Why is no real title available?)
• scientific article; zbMATH DE number 3349346 (Why is no real title available?)
• An Error Correcting Procedure for Learning with an Imperfect Teacher
• Feature Selection in Pattern Recognition
• On feature extraction in pattern recognition†
• On the Extraction of Pattern Features from Continuous Measurements
• On the Extraction of Pattern Features from Imperfectly Identified Samples
• On the best finite set of linear observables for discriminating two Gaussian signals
• Probability of error, equivocation, and the Chernoff bound

Cited in

(2)

• Estimation of probabilities of label imperfections and correction of mislabels
• Learning with imperfectly labeled patterns

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