scientific article; zbMATH DE number 3586920
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Publication:4156682
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(10)- A Circuit Model for Fault Tolerance in the Reliable Assembly of Nano-systems
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- About the reliability of circuits under failures of type 0 at the outputs of elements in a complete finite basis containing some pairs of functions
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- Estimations of unreliability of circuits in Rosser-Turkett basis (in \(P_3)\) with faults of type 0 at the outputs of gates
- On the design of reliable Boolean circuits that contain partially unreliable gates
- Sufficient conditions for implementation of Boolean functions by asymptotically optimal on reliability circuits with the trivial estimate of unreliability in the case of faults of type 0 at the element outputs
- About the reliability of logic circuits in all complete bases with three-input elements and failures of zero type on their outputs
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