A new exponentially fitted triangular finite element method for the continuity equations in the drift-diffusion model of semiconductor devices
From MaRDI portal
Publication:4238328
DOI10.1051/m2an:1999107zbMath0961.82030OpenAlexW2146253837MaRDI QIDQ4238328
Publication date: 13 April 1999
Published in: ESAIM: Mathematical Modelling and Numerical Analysis (Search for Journal in Brave)
Full work available at URL: https://eudml.org/doc/197559
finite element methoderror boundsdrift-diffusion modelScharfetter-Gummel methodsemiconductor devices
Related Items
A class of finite element methods with averaging techniques for solving the three-dimensional drift-diffusion model in semiconductor device simulations, A novel exponentially fitted triangular finite element method for an advection-diffusion problem with boundary layers, A parameter-free stabilized finite element method for scalar advection-diffusion problems, Three-dimensional exponentially fitted conforming tetrahedral finite elements for the semiconductor continuity equations, A new control volume finite element method for the stable and accurate solution of the drift-diffusion equations on general unstructured grids, A Conforming Exponentially Fitted Finite Element Scheme for the Semiconductor Continuity Equations in 3D, An analysis of a conforming exponentially fitted finite element method for a convection-diffusion problem
