scientific article; zbMATH DE number 1033831
automatic test pattern generationBoolean circuitscircuit equivalence testingcombinatorial logic circuitscombinatorial network analysisfault detectionimplicantlogic optimizationlogic synthesislogic verificationmulti-level integrated circuitsrecursive learningswitching theorytest generation
Research exposition (monographs, survey articles) pertaining to computer science (68-02) Reliability, testing and fault tolerance of networks and computer systems (68M15) Research exposition (monographs, survey articles) pertaining to information and communication theory (94-02) Fault detection; testing in circuits and networks (94C12)
- Propagation based local search for bit-precise reasoning
- GridSAT: Design and implementation of a computational grid application
- scientific article; zbMATH DE number 996555 (Why is no real title available?)
- Test Pattern Generation using Boolean Proof Engines
- scientific article; zbMATH DE number 2089878 (Why is no real title available?)
- Local Search For Satisfiability Modulo Integer Arithmetic Theories
- Bitwuzla
- Solvability and control design for synchronization of Boolean networks
This page was built for publication:
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4344221)