Bayesian reliability analysis using the Dirichlet prior distribution with emphasis on accelerated life testing run in random order
DOI10.1016/S0362-546X(96)00120-4zbMATH Open0892.62074MaRDI QIDQ4378929FDOQ4378929
Authors: Ian F. Somerville, Duane L. Dietrich, Thomas A. Mazzuchi 
Publication date: 1997
Published in: Nonlinear Analysis: Theory, Methods & Applications (Search for Journal in Brave)
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Dirichlet priordesign of experimentreliability growthrandom orderingaccelerated life testsordered reliabilitiesdevelopment testingmultiple stress environment testing
Cites Work
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- A Bayesian Note on Reliability Growth During a Development Testing Program
- A Bayes method for assessing product-reliability during development testing
- A Bayes Reliability Growth Model for A Development Testing Program
Cited In (4)
- ON BAYESIAN ANALYSIS OF BINOMIAL RELIABILITY GROWTH
- Bayesian evaluation method for reliability growth test based on the ordered Dirichlet distribution
- Generalized beta prior models on fraction defective in reliability test planning
- A general Bayes exponential inference model for accelerated life testing
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