scientific article; zbMATH DE number 1956608
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Publication:4417958
zbMATH Open1031.68509MaRDI QIDQ4417958FDOQ4417958
Authors: Fabrice Baray, Philippe Codognet, Daniel Diaz, Henri Michel
Publication date: 30 July 2003
Full work available at URL: http://link.springer.de/link/service/series/0558/bibs/2619/26190569.htm
Title of this publication is not available (Why is that?)
Recommendations
- Microprocessor architectural automatic test program generation
- Functional Testing of Microprocessors
- Efficient techniques for automatic verification-oriented test set optimization
- Generation of test data for verification of caching mechanisms and address translation in microprocessors
- Testing diagnostics of modern microprocessors with the use of functional models
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- Microprocessor architectural automatic test program generation
- High-level synthesis techniques for functional test pattern execution
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- Efficient techniques for automatic verification-oriented test set optimization
- Generation of test data for verification of caching mechanisms and address translation in microprocessors
- Functional Testing of Microprocessors
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