scientific article; zbMATH DE number 1755715
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Publication:4535565
zbMATH Open0986.68627MaRDI QIDQ4535565FDOQ4535565
Authors: Hideyuki Maki, Yuko Teranishi
Publication date: 16 June 2002
Full work available at URL: http://link.springer.de/link/service/series/0558/bibs/2114/21140093
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- Development of a framework for analyzing process monitoring data with applications to semiconductor manufacturing process
- Real-manufacturing-oriented big data analysis and data value evaluation with domain knowledge
- Automating the diagnosis and rectification of deflection yoke production using hybrid knowledge acquisition and case-based reasoning
- Combined DEMATEL technique with hybrid MCDM methods for creating the aspired intelligent global manufacturing \& logistics systems
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