A new class of sequential circuits with combinational test generation complexity

DOI10.1109/12.869321zbMath1391.94896OpenAlexW2134921041MaRDI QIDQ4571371

Hideo Fujiwara

Publication date: 9 July 2018

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://semanticscholar.org/paper/d11d90e6828d9a63ca4c69be2eb5bf9bcc42437c

Mathematics Subject Classification ID

Formal languages and automata (68Q45) Analytic circuit theory (94C05)

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