A new class of sequential circuits with combinational test generation complexity (Q4571371)
From MaRDI portal
!
This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use the normal view instead:
scientific article; zbMATH DE number 6899521
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | A new class of sequential circuits with combinational test generation complexity |
scientific article; zbMATH DE number 6899521 |
Statements
A new class of sequential circuits with combinational test generation complexity (English)
0 references
9 July 2018
0 references
