The M-Bayesian credible limits of the reliability derived from binomial distribution
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Publication:4649604
DOI10.1080/03610926.2012.688911zbMATH Open1284.62623OpenAlexW2322159502MaRDI QIDQ4649604FDOQ4649604
Authors: Ming Han
Publication date: 12 November 2012
Published in: Communications in Statistics: Theory and Methods (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610926.2012.688911
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Cites Work
- Hierarchical Bayesian nonparametric mixture models for clustering with variable relevance determination
- Hierarchical Bayesian analysis of the seemingly unrelated regression and simultaneous equations models using a combination of direct Monte Carlo and importance sampling techniques
- A Bayesian hierarchical model for the measurement of working memory capacity
- ON BAYESIAN ANALYSIS OF BINOMIAL RELIABILITY GROWTH
- E-Bayesian estimation of the reliability derived from binomial distribution
- E-Bayesian estimation and hierarchical Bayesian estimation of failure probability
Cited In (7)
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- E-Bayesian estimations of the reliability and its E-posterior risk under different loss functions
- Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution
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- \(M\)-Bayesian credible limit method of parameter and its application
- Two-Sided M-Bayesian Credible Limits Method of Reliability Parameters and Its Applications
- M-Bayesian credible limits of reliability parameters
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