Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution

DOI10.1016/j.apm.2013.10.054zbMath1428.62460OpenAlexW4237382587MaRDI QIDQ1630200

Tian-Qun Xu, Yue-Peng Chen

Publication date: 7 December 2018

Published in: Applied Mathematical Modelling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.apm.2013.10.054

zbMATH Keywords

reliabilityexponential distributionfailure ratetwo-sided M-Bayesian credible limitzero-failure data

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

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Cites Work

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• E-Bayesian estimation and hierarchical Bayesian estimation of failure rate
• Statistical decision theory and Bayesian analysis. 2nd ed
• Two-Sided M-Bayesian Credible Limits Method of Reliability Parameters and Its Applications
• The M-Bayesian Credible Limits of the Reliability Derived from Binomial Distribution

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