Reliability assessment for very few failure data and Weibull distribution
Summary: Only very few failure data can be obtained for the time censored test of high-reliability and long-life products. For very few failure data, the current methods fail to obtain both the point estimation and confidence interval of reliability parameters. If the point estimation and confidence interval of reliability parameters are obtained based on different methods, the results tend to be unreliable. In this study, based on the existing research, a Bayesian reliability evaluation method for very few failure data under the Weibull distribution was proposed. First, the range of failure probability was limited based on the convexity and self-features of the Weibull distribution function. Second, based on the background of the sample with very few failure data, the pretest distribution function and parameters were set and solved. The point estimation and confidence interval model of failure probability based on the Bayesian formula was established. The improved match distribution curve method was used to compute both the point estimation and confidence interval of reliability parameters. Furthermore, by comparing the results of numerical examples, the calculation results obtained by the proposed method were verified as being very reasonable. Finally, taking wet friction plates as an example, the results showed the effectiveness of this method in engineering practice.
- Bayesian analysis of data with only one failure
- Bayesian reliability of the Weibull failure model with bivariate characterization of the parameters
- Reliability test for Weibull zero failure-data
- Reliability analysis for Weibull distribution with homogeneous heavily censored data based on Bayesian and least-squares methods
- Weibull failure probability estimation based on zero-failure data
- Bayesian inference under progressive type-I interval censoring
- scientific article; zbMATH DE number 938956 (Why is no real title available?)
- Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution
- Weibull failure probability estimation based on zero-failure data
- Reliability analysis for Weibull distribution with homogeneous heavily censored data based on Bayesian and least-squares methods
- Reliability evaluation with limited and censored time-to-failure data based on uncertainty distributions
- Interval statistic based reliability analysis method on small sample hot test of satellite thruster
- Reliability tests for Weibull distribution with variational shape parameter based on sudden death lifetime data
- Weibull modeling and parameter estimation methods of failure data
- Reliability analysis using Weibull lifetime data and expert opinion
- Weibull data analysis with few or no failures
- scientific article; zbMATH DE number 5260191 (Why is no real title available?)
- Reliability estimation under scarcity of data: a comparison of three approaches
This page was built for publication: Reliability assessment for very few failure data and Weibull distribution
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2298945)