Reliability assessment for very few failure data and Weibull distribution

DOI10.1155/2019/8947905zbMath1435.62372OpenAlexW2976425086WikidataQ127204494 ScholiaQ127204494MaRDI QIDQ2298945

Guang Jin, Yang You, Lu-Lu Zhang

Publication date: 20 February 2020

Published in: Mathematical Problems in Engineering (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1155/2019/8947905

Mathematics Subject Classification ID

Reliability and life testing (62N05)

Cites Work

• Unnamed Item
• Two-sided M-Bayesian credible limits of reliability parameters in the case of zero-failure data for exponential distribution
• Weibull failure probability estimation based on zero-failure data
• Bayesian inference under progressive type-I interval censoring

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