scientific article; zbMATH DE number 1836107
From MaRDI portal
Publication:4779628
zbMATH Open1066.65089MaRDI QIDQ4779628FDOQ4779628
Authors: Qing Yang
Publication date: 2002
Title of this publication is not available (Why is that?)
Recommendations
- scientific article; zbMATH DE number 1910730
- scientific article; zbMATH DE number 1819939
- The characteristic finite element alternating-direction method with moving meshes for the transient behavior of a semiconductor device
- Characteristic difference methods and \(L^\infty\)-error estimates for the semiconductor device of two dimensions
- Characteristic finite difference fractional step methods for three-dimensional semiconductor device of heat conduction
Finite difference methods for initial value and initial-boundary value problems involving PDEs (65M06) Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs (65M60) Statistical mechanics of semiconductors (82D37)
Cited In (4)
- Characteristic difference methods and \(L^\infty\)-error estimates for the semiconductor device of two dimensions
- Title not available (Why is that?)
- The characteristic finite element alternating-direction method with moving meshes for the transient behavior of a semiconductor device
- Title not available (Why is that?)
This page was built for publication:
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4779628)