ON BAYESIAN ANALYSIS OF BINOMIAL RELIABILITY GROWTH

DOI10.14490/JJSS.32.1zbMath1114.62321OpenAlexW2092286368MaRDI QIDQ4787555

Yonghui Zhao, Qi-Guang Wu, Guo-Ying Li

Publication date: 7 January 2003

Published in: JOURNAL OF THE JAPAN STATISTICAL SOCIETY (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.14490/jjss.32.1

zbMATH Keywords

posterior densityprior distributionsmonotone modelattribute reliability growthBayesian lower bound

Mathematics Subject Classification ID

Bayesian inference (62F15) Reliability and life testing (62N05)

Related Items (6)

A study on the effect of the loss function on Bayesian estimation and posterior risk of binomial distribution ⋮ E-Bayesian estimations of the reliability and its E-posterior risk under different loss functions ⋮ A note on the posterior risk of the entropy loss function ⋮ The M-Bayesian Credible Limits of the Reliability Derived from Binomial Distribution ⋮ E-Bayesian estimation of the reliability derived from binomial distribution ⋮ A new inherent reliability modeling and analysis method based on imprecise Dirichlet model for machine tool spindle

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