scientific article; zbMATH DE number 1910730
convergencefinite element methodnumerical experimentinitial boundary value problemsemiconductor devicemethod of characteristicsparabolic-elliptic coupled systemvariable grid
Stability and convergence of numerical methods for initial value and initial-boundary value problems involving PDEs (65M12) Error bounds for initial value and initial-boundary value problems involving PDEs (65M15) Numerical aspects of the method of characteristics for initial value and initial-boundary value problems involving PDEs (65M25) Mesh generation, refinement, and adaptive methods for the numerical solution of initial value and initial-boundary value problems involving PDEs (65M50) Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs (65M60) PDEs of mixed type (35M10)
- scientific article; zbMATH DE number 1836107
- Two-grid method for semiconductor device problem by mixed finite element method and characteristics finite element method
- The characteristic finite element alternating-direction method with moving meshes for the transient behavior of a semiconductor device
- The characteristic finite volume element method for 1-D semiconductor device simulation
- An approximation of semiconductor device by mixed finite element method and characteristics-mixed finite element method
- scientific article; zbMATH DE number 1836107 (Why is no real title available?)
- The characteristic finite element alternating-direction method with moving meshes for the transient behavior of a semiconductor device
- Two-grid method for semiconductor device problem by mixed finite element method and characteristics finite element method
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