Method of integral equations in the spectral domain for the analysis of plane defects of a substrate

DOI10.1134/S0012266114090055MaRDI QIDQ486262zbMATH OpenOpenAlexFDO

Authors V. V. Lopushenko, Yu. A. Eremin

Publication date 15 January 2015

Published in Differential Equations (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1134/s0012266114090055

zbMATH Keywords

scatteringspectral domainvolume integral equationsconvolutional approach

Mathematics Subject Classification ID

Diffraction, scattering (78A45) Integro-partial differential equations (45K05) Numerical methods for integral equations (65R20) Integral equations of the convolution type (Abel, Picard, Toeplitz and Wiener-Hopf type) (45E10)

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Cites work

• Control of motion of an actively bending body in prescribed channels with viscous friction
• Integro-functional representations with complex support for wave fields

Cited in

(6)

• Analysis of plane cylindrical wafer defects by the spectral-domain integral equation method
• Spectral-domain integral equation method for modeling the scattering properties of a group of planar particles in the presence of a substrate
• Analysis of the radiation properties of a planar antenna on a photonic crystal substrate.
• Mathematical model of diffraction based on integral equations in the spectral domain
• Investigation of plane defects in a dielectric wafer by spectral-domain integral equation method
• Application of invariant integrals to the problems of defect identification

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