Method of integral equations in the spectral domain for the analysis of plane defects of a substrate
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Publication:486262
DOI10.1134/S0012266114090055zbMath1315.78008OpenAlexW2084402703MaRDI QIDQ486262
V. V. Lopushenko, Yu. A. Eremin
Publication date: 15 January 2015
Published in: Differential Equations (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1134/s0012266114090055
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Related Items (3)
Spectral-domain integral equation method for modeling the scattering properties of a group of planar particles in the presence of a substrate ⋮ Investigation of plane defects in a dielectric wafer by spectral-domain integral equation method ⋮ Analysis of plane cylindrical wafer defects by the spectral-domain integral equation method
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