Investigation of plane defects in a dielectric wafer by spectral-domain integral equation method
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Publication:1705387
DOI10.1007/S10598-016-9345-YzbMath1382.78007OpenAlexW2565850158MaRDI QIDQ1705387
Publication date: 15 March 2018
Published in: Computational Mathematics and Modeling (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1007/s10598-016-9345-y
Diffraction, scattering (78A45) Spectral, collocation and related methods applied to problems in optics and electromagnetic theory (78M22)
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