Complete tests relative to displacing faults of inputs of circuits
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Publication:493886
DOI10.3103/S0027132215010076zbMATH Open1359.94942MaRDI QIDQ493886FDOQ493886
Authors: E. V. Morozov 
Publication date: 4 September 2015
Published in: Moscow University Mathematics Bulletin (Search for Journal in Brave)
Recommendations
- Tests with stuck-at and shift faults on circuit inputs
- Tests concerning certain types of faults at the scheme inputs
- On tests detecting certain faults of circuit inputs for almost all Boolean functions
- Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits
- On the length of diagnostic tests for Boolean circuits
Cites Work
- On complete fault-detection tests under local coalescences of variables in Boolean functions
- Title not available (Why is that?)
- Title not available (Why is that?)
- Diagnostic tests for local coalescences of variables in Boolean functions
- Title not available (Why is that?)
- Title not available (Why is that?)
Cited In (8)
- Tests with stuck-at and shift faults on circuit inputs
- On diagnostic test sets for local mirror reflections on circuit inputs
- Title not available (Why is that?)
- Exhaustive testing of almost all devices with outputs depending on limited number of inputs
- On tests detecting certain faults of circuit inputs for almost all Boolean functions
- On test sets concerning local stuck-at faults of fixed multiplicity at the inputs of circuits
- Tests concerning certain types of faults at the scheme inputs
- Diagnostic tests for discrete functions defined on rings
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