Analysis of simple step-stress accelerated life test data from Lindley distribution under type-I censoring
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Publication:4965758
DOI10.6092/ISSN.1973-2201/6243zbMATH Open1454.62300OpenAlexW2582919059MaRDI QIDQ4965758FDOQ4965758
Authors: Varghese A. Sharon, V. S. Vaidyanathan 
Publication date: 10 March 2021
Full work available at URL: https://doaj.org/article/e9736c5472d04d25835220fd57c84e01
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Point estimation (62F10) Reliability and life testing (62N05) Parametric tolerance and confidence regions (62F25)
Cites Work
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- On the Lambert \(w\) function
- Accelerated Testing
- Lindley distribution and its application
- Accelerated Life Testing - Step-Stress Models and Data Analyses
- Optimum simple step-stress accelerated life tests with censoring
- Optimum Simple Step-Stress Plans for Accelerated Life Testing
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- Asymptotic comparison between constant-stress testing and step-stress testing for type-I censored data from exponential distribution
- Optimum simple step-stress accelerated life-tests with competing causes of failure
Cited In (6)
- On a Generalized Lindley Distribution
- On point prediction of new lifetimes under a simple step-stress model for censored Lomax data
- Estimating costs of maintenance service policy using step-stress partially accelerated life testing for Lindley distribution under type II censoring
- Classical methods of estimation on constant stress accelerated life tests under exponentiated Lindley distribution
- Likelihood and Bayesian estimations for step-stress life test model under type-I censoring
- Parameter estimation of Lindley step stress model with independent competing risk under type 1 censoring
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