Goodness-of-fit tests for one-shot device accelerated life testing data

DOI10.1080/03610918.2015.1102937MaRDI QIDQ4976564zbMATH OpenOpenAlexFDO

Authors Ekaterina V. Chimitova, Narayanaswamy Balakrishnan

Publication date 31 July 2017

Published in Communications in Statistics. Simulation and Computation (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1080/03610918.2015.1102937

zbMATH Keywords

powergoodness-of-fit testsMonte Carlo simulationscurrent status datanonparametric maximum likelihood estimationone-shot devicesparametric AFT model

Mathematics Subject Classification ID

Parametric hypothesis testing (62F03) Reliability and life testing (62N05)

Recommendations

• Testing goodness of fit of parametric AFT and PH models with residuals
• Chi-squared goodness-of-fit tests for parametric accelerated failure time models
• Testing goodness-of-fit for some lifetime distributions with conventional type-I censoring
• Quasi goodness of fit tests for lifetime distributions
• On goodness-of-fit for accelerated life models

Cited in

(5)

• Determination of warranty length for one-shot devices with Rayleigh lifetime distribution
• Power divergence approach for one-shot device testing under competing risks
• Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data
• Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks
• Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution

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