Goodness-of-fit tests for one-shot device accelerated life testing data
DOI10.1080/03610918.2015.1102937zbMATH Open1368.62264OpenAlexW2340766493MaRDI QIDQ4976564FDOQ4976564
Authors: Ekaterina V. Chimitova, Narayanaswamy Balakrishnan 
Publication date: 31 July 2017
Published in: Communications in Statistics. Simulation and Computation (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1080/03610918.2015.1102937
Recommendations
- Testing goodness of fit of parametric AFT and PH models with residuals
- Chi-squared goodness-of-fit tests for parametric accelerated failure time models
- Testing goodness-of-fit for some lifetime distributions with conventional type-I censoring
- Quasi goodness of fit tests for lifetime distributions
- On goodness-of-fit for accelerated life models
powergoodness-of-fit testsMonte Carlo simulationscurrent status datanonparametric maximum likelihood estimationone-shot devicesparametric AFT model
Cited In (5)
- Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks
- Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution
- Power divergence approach for one-shot device testing under competing risks
- Determination of warranty length for one-shot devices with Rayleigh lifetime distribution
- Robust estimators for one-shot device testing data under gamma lifetime model with an application to a tumor toxicological data
This page was built for publication: Goodness-of-fit tests for one-shot device accelerated life testing data
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4976564)
